Open Access
ONE-SHOT THREE-DIMENSIONAL SURFACE PROFILOMETRY USING DMD-BASED TWO-FREQUENCY MOIRÉ AND FOURIER TRANSFORM TECHNIQUE
L. C. Chen/ C. H. Cho/ X. L. Nguyen
DOI: 10.21307/ijssis-2017-355
Professor Subhas Chandra Mukhopadhyay
Exeley Inc. (New York)
Subject: Computational Science & Engineering, Engineering, Electrical & Electronic
eISSN: 1178-5608
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VOLUME 2 , ISSUE 3 (September 2009) - List of articles
L. C. Chen/ C. H. Cho/ X. L. Nguyen
DOI: 10.21307/ijssis-2017-355
S.C. Mukhopadhyay/ S.C. Mukhopadhyay
DOI: 10.21307/ijssis-2017-356
M. F. Rahmat/ N. S. Kamaruddin/ M. D. Isa/ M. F. Rahmat/ N. S. Kamaruddin/ M. D. Isa
DOI: 10.21307/ijssis-2017-357
S. Neduncheliyan/ M. Umapathy/ D. Ezhilarasi
DOI: 10.21307/ijssis-2017-358
C. RoyChaudhuri/ S K Datta/ H. Saha
DOI: 10.21307/ijssis-2017-359
Allal LARBI/ Bachir DJEDOU/ Layachi BENNACER/ Mounir BOUSBIA-SALAH
DOI: 10.21307/ijssis-2017-360
M. Shanmugavalli/ G. Uma/ M. Umapathy
DOI: 10.21307/ijssis-2017-361
B. Vasuki/ M. Umapathy/ A. R. Senthilkumarr
DOI: 10.21307/ijssis-2017-362
S. O’Keeffe/ E. Lewis
DOI: 10.21307/ijssis-2017-363
Divya Haridas/ Arijit Chowdhuri/ K. Sreenivas/ Vinay Gupta
DOI: 10.21307/ijssis-2017-364